Mt. Yang et al., ENHANCED DEVICE PERFORMANCE BY UNSTRAINED IN0.3GA0.7AS IN0.29AL0.71ASDOPED-CHANNEL FET ON GAAS SUBSTRATES/, IEEE electron device letters, 17(8), 1996, pp. 410-412
An alternative In0.3Ga0.7As/In0.29Al0.71As heterostructure based on Ga
As is proposed, which provides a large conduction-band discontinuity f
or a better carrier confinement, resulting in a high-carrier density,
This unstrained high-In channel achieved a better device performance,
as compared with the conventional pseudomorphic channel, which is alwa
ys limited by the critical thickness. This unstrained channel is also
proven to be more stable after a long-term biased-stress.