A new variety of ultra-long tips for atomic force microscopy has been
fabricated using photoetchable glass. Photoetchable glass is structure
d by UV exposure through a quartz mask followed by a heat treatment an
d etch process in hydrofluoric acid. The process is based on different
etching rates with a ratio of about 1:20 between unexposed and expose
d parts of the glass. Tips longer than 100 mu m with a tip radius down
to 20 nm are possible. The cantilevers are made from silicon carbide.
The mechanical properties of such long tips are compared, in theory a
nd in practice, with conventional cantilevers from silicon and silicon
nitride. Their strong sensitivity to friction forces for contrast for
mation in atomic force microscopy is discussed.