ELECTRONIC-STRUCTURE, ELECTRONIC DECAY, AND DESORPTION PROCESSES OF MOLECULAR-SOLID SICL4 FOLLOWING CORE-LEVEL EXCITATION

We report high-resolution Si L(23)-edge rotal-electron-yield (TEY) mea surements from solid SiCl4, and a comparison with the gas-phase photoa bsorption data to characterize the Si(2p) pre-edge spectral features. By applying resonant photoemission spectroscopy, the spectator Auger p rocess is found to be the major decay channel for the resonantly excit ed Si(2p) core hole of condensed SiCl4. Participant Auger decay makes a notable contribution to the resonant Auger processes for con-to-vale nce excitation. The close resemblance of the photon-stimulated desorpt ion ion spectra and the TEY spectrum was interpreted in terms of the A uger-initiated desorption or Knotek-Feibelman mechanism.