BUILT-IN SELF-TEST AND DIAGNOSTIC SUPPORT FOR SAFETY-CRITICAL MICROSYSTEMS

Sensors and actuators with built-in local intelligence are often descr ibed as microsystems. The integration of processing electronics at the sensor and actuator level enables the distribution of processing task s such as calibration and filtering as well as test and diagnostic fun ctions from upper system hierarchies to lower levels. This paper descr ibes Built-In-Self-Test (BIST) and diagnostic strategies for Safety Cr itical Microsystems. It compares different approaches and demonstrates the importance of utilising Reliability Indicators (Rls) for on-chip monitoring and diagnostics. The close relationship between Design for Testability (DfT) for post-production tests and the BIST strategies fo r on-line monitoring is outlined. A multichip design strategy is descr ibed for an example microsystem. Crown Copyright (C) 1996 Elsevier Sci ence Ltd.