MICROSCOPIC DESCRIPTION OF THE ELECTRODE SURFACE AND DOUBLE-LAYER CAPACITY AT THE ELECTRODE SOLUTION INTERFACE/

The analysis of the capacitance incorporating the variations with the surface charge density of the image plane position and of the metal/so lvent distance of closest approach is discussed. The relation with oth er theoretical models and with some recent experimental studies of the electrode/solution interface is analysed. The proper interpretation o f the semi-empirical contribution for the solvent obtained by correcti ng the inner-layer capacitance by a theoretical contribution associate d with the metal non-ideality is emphasized. The use of this semi-empi rical contribution for discussing solvent orientation (different solve nt with same electrode and vice versa) is finally considered. Copyrigh t (C) 1996 Elsevier Science Ltd