DETERMINATION OF THE ELECTRONIC DENSITY-OF-STATES NEAR BURIED INTERFACES - APPLICATION TO CO CU MULTILAYERS/

Citation
A. Nilsson et al., DETERMINATION OF THE ELECTRONIC DENSITY-OF-STATES NEAR BURIED INTERFACES - APPLICATION TO CO CU MULTILAYERS/, Physical review. B, Condensed matter, 54(4), 1996, pp. 2917-2921
Citations number
27
Categorie Soggetti
Physics, Condensed Matter
ISSN journal
01631829
Volume
54
Issue
4
Year of publication
1996
Pages
2917 - 2921
Database
ISI
SICI code
0163-1829(1996)54:4<2917:DOTEDN>2.0.ZU;2-K
Abstract
High-resolution L(3) x-ray absorption and emission spectra of Co and C u in Co/Cu multilayers are shown to provide unique information on the occupied and unoccupied density of d states near buried interfaces. Th e d bands of both Co and Cu interfacial layers are shown to be conside rably narrowed relative to the bulk metals, and for Cu interface layer s the d density of states is found to be enhanced near the Fermi level . The experimental results are confirmed by self-consistent electronic structure calculations.