ON THE UNIQUE EVALUATION OF LOCAL LATTICE-PARAMETERS BY CONVERGENT-BEAM ELECTRON-DIFFRACTION

We summarize some practical aspects of using convergent-beam electron diffraction (CBED) patterns for determination of three-dimensional lat tice parameters in crystalline materials. Owing to the insensitivities of certain lattice spacings to changes in lattice parameters, and to measurement errors imposed by finite higher-order Laue zone (HOLZ) lin ewidths, most CBED patterns can be simulated by a number of different lattice parameter combinations. Unique combinations are found by fitti ng several patterns obtained from the same area. In cases where a uniq ue set of all six parameters cannot be found, semiquantitative informa tion about elastic stress and strain states can still be extracted. Th e number of obtainable lattice parameters is affected by the symmetry of the pattern and by the specific HOLZ reflections which are present, for a given accelerating voltage. Symmetry-breaking distortions in pa tterns from nominally orthorhombic systems can often be attributed to deviations in lattice angles as small as 0.01-0.02 degrees away from 9 0 degrees, even if such angular distortions are not expected from know ledge of the material's bulk behaviour. The correct simulation of CBED patterns further requires consideration of foil thinning artefacts on HOLZ line positions. We show that an intelligent choice of zone axis can provide useful information even from difficult sample geometries.