ELECTRON-DIFFRACTION STUDIES OF EPITAXIAL C-60 THIN-FILMS ON MICA(001)

Authors
LINDNER JKN HENKE S RAUSCHENBACH B STRITZKER B
Citation
Jkn. Lindner et al., ELECTRON-DIFFRACTION STUDIES OF EPITAXIAL C-60 THIN-FILMS ON MICA(001), Thin solid films, 279(1-2), 1996, pp. 106-109
Citations number
9
Categorie Soggetti
Physics, Applied","Material Science","Physics, Condensed Matter
Journal title
Thin solid films → ACNP
ISSN journal
00406090
Volume
279
Issue
1-2
Year of publication
1996
Pages
106 - 109
Database
ISI
SICI code
0040-6090(1996)279:1-2<106:ESOECT>2.0.ZU;2-Q
Abstract
C-60 thin films were thermally evaporated onto mica(001) substrates at a temperature of 200 degrees C and a deposition rate of 0.5 Angstrom s(-1). The 2500 Angstrom thick films were studied using high-voltage t ransmission electron microscopy (HVTEM) and electron diffraction. Orie nted growth of C-60 on mica with C-60(111)parallel to mica(001) was ob served as well as twin formation about the three <[11(1)over bar ]> ax es. The observed orientation relationships are discussed on the basis of structural considerations.