X-RAY PHOTOELECTRON-SPECTROSCOPY OF ZN1-XCDXSE THIN-FILMS

X-ray photoelectron spectra (XPS) have been recorded for electron beam deposited Zn1-xCdxSe (0 < x < 1) thin films on glass substrates at ro om temperature. The chemical composition (x), core level binding energ ies, Auger parameter (ct) and ionicity (f(i)) have been estimated from XPS data of these films. The films in general have shown selenium def iciency for all the compositions. The variation in Auger parameter for Zn, Cd and Se in the thin films with different compositions is not si gnificant and is found to be for Zn (2011.3-2012.2 eV), for Cd (786.1- 786.6 eV) and for Se (1360.2-1361.4 eV). The f(i) values are in the ra nge 0.639-0.680 depending upon the composition of the films. The effec t of argon ion bombardment on composition has been investigated.