INPLANE PERIODIC BICRYSTALLINITY IN MAGNETIC THIN-FILMS

Citation
M. Sussiau et al., INPLANE PERIODIC BICRYSTALLINITY IN MAGNETIC THIN-FILMS, Applied physics letters, 69(6), 1996, pp. 857-859
Citations number
14
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00036951
Volume
69
Issue
6
Year of publication
1996
Pages
857 - 859
Database
ISI
SICI code
0003-6951(1996)69:6<857:IPBIMT>2.0.ZU;2-Z
Abstract
Magnetic thin films have been deposited by molecular beam epitaxy on v icinal Si(111) substrates misoriented towards [11-2]. The substrates w ere thermally pretreated in order to activate the step bunching mechan ism, which results in a laterally modulated surface topology with a pe riod of similar to 800 Angstrom. Cobalt or permalloy layers grown on s uch surfaces exhibit an in-plane uniaxial magnetic anisotropy. This an isotropy is associated with the lateral pseudoperiodic variation of th e crystalline orientation of the metallic layers as observed by transm ission electron microscopy. Magnetoresistance measurements on microstr uctured films reveal a single-domain behavior with a magnetization rev ersal by rotation. (C) 1996 American Institute of Physics.