Magnetic thin films have been deposited by molecular beam epitaxy on v
icinal Si(111) substrates misoriented towards [11-2]. The substrates w
ere thermally pretreated in order to activate the step bunching mechan
ism, which results in a laterally modulated surface topology with a pe
riod of similar to 800 Angstrom. Cobalt or permalloy layers grown on s
uch surfaces exhibit an in-plane uniaxial magnetic anisotropy. This an
isotropy is associated with the lateral pseudoperiodic variation of th
e crystalline orientation of the metallic layers as observed by transm
ission electron microscopy. Magnetoresistance measurements on microstr
uctured films reveal a single-domain behavior with a magnetization rev
ersal by rotation. (C) 1996 American Institute of Physics.