D. Dimovamalinovska et al., CORRELATION BETWEEN THE PHOTOLUMINESCENCE AND CHEMICAL BONDING IN POROUS SILICON, Solid state communications, 99(9), 1996, pp. 641-644
The photoluminescence and X-ray photoelectron spectra of porous silico
n prepared by electrochemical etching have been studied. A correlation
between photoluminescence intensity and oxidized valence states of Si
has been observed. The results show that porous silicon having suboxi
de states of Si exhibits very intense photoluminescence which depends
on the chemical bonding. Copyright (C) 1996 Elsevier Science Ltd