A. Shinmi et al., FORMATION OF SI3N4 DURING THE DIRECT NITR IDATION OF SI SINGLE-CRYSTAL, Nippon Seramikkusu Kyokai gakujutsu ronbunshi, 104(7), 1996, pp. 662-667
Single crystal Si was nitrided in a fluidized-bed reactor. The volume
fraction of the alpha/beta phases and the nitridation process were stu
died by X-ray diffraction and electron microscopy. No difference in th
e alpha/beta ratio and the nitridation rate were found between pure Si
single crystal and commercial Si powder including impurities. This in
dicates that the alpha/beta ratio is not affected by the impurity cont
ent. Microstructural observation revealed the internal fracture of Si
to several-micron pieces and the formation of Si3N4 needles in the ear
ly stage of nitridation. Pores were also observed in the fractured Si
pieces and the size increased with the progress of nitridation. Aggreg
ation of Si3N4 in a band shape and a group of dislocations, forming sm
all angle boundaries, were also observed in the Si piece. The fracture
of the Si single crystal appears to be caused by segregation of nitro
gen along dislocations, introduced during fluidization, and subsequent
formation of Si3N4.