MICROSTRUCTURE AND FRACTAL FORMATION OF ANNEALED GE-AU FILM AND GE-AUAU BILAYER FILMS/

Citation
L. Ba et al., MICROSTRUCTURE AND FRACTAL FORMATION OF ANNEALED GE-AU FILM AND GE-AUAU BILAYER FILMS/, Acta physica Sinica, 5(7), 1996, pp. 530-537
Citations number
7
Categorie Soggetti
Physics
Journal title
ISSN journal
10003290
Volume
5
Issue
7
Year of publication
1996
Pages
530 - 537
Database
ISI
SICI code
1000-3290(1996)5:7<530:MAFFOA>2.0.ZU;2-7
Abstract
The as-deposited and annealed Ge-Au film and Ge-Au/Au bilayer films ha ve been observed by transmission electron microscopy. The bilayer with a, composition of Ge-5at%Au film is amorphous, while the Ge-22at%Au f ilm is polycrystalline. Higher concentration of Au raises the structur al heterogeneity and instability. Fractals can be observed in the Ge-5 at%Au/Au bilayer samples annealed at 60-100 degrees C. The difference of the fractal patterns generated from Ge-Au/Au and a-Ge/Au films can be attributed to the higher heterogeneity and instability in Ge-Au/Au bilayers.