MULTILAYER TECHNOLOGY FOR DIFFRACTIVE OPTICAL-ELEMENTS

Citation
B. Goebel et al., MULTILAYER TECHNOLOGY FOR DIFFRACTIVE OPTICAL-ELEMENTS, Applied optics, 35(22), 1996, pp. 4490-4493
Citations number
7
Categorie Soggetti
Optics
Journal title
ISSN journal
00036935
Volume
35
Issue
22
Year of publication
1996
Pages
4490 - 4493
Database
ISI
SICI code
0003-6935(1996)35:22<4490:MTFDO>2.0.ZU;2-L
Abstract
The proposed multilayer technology makes it possible to approximate a continuous phase distribution by discrete phase steps. Compared with b inary techniques, a higher diffraction efficiency can be achieved. In most known processes a bulk substrate is used and etched directly; the refore it is difficult to control the height of the phase steps. We pr opose applying layers of a well-known thickness and structuring them w ith a selective etching process. In this new multilayer process for re flecting elements a system of metal and dielectric layers is used that can easily be produced by standard methods. (C) 1996 Optical Society of America