In this gaper, we report the models of fast recrystallization processe
s in a-Si thin films. An important feature of the modeling of nucleati
on in a-Si films is the capability of allowing description of non-equi
librium solidification including the distribution of small crystalline
clusters which can be responsible for visible photoluminescence. We i
ntegrate the results of the description of nucleation and growth on th
e phase interface of c-Si from a-Si or l-Si. The transient time, nucle
ation rate and growth rate were determined as a function of temperatur
e and the position of local extremes of these functions were stated. T
he solidification velocity was calculated from the nucleation rate and
growth rate with respect to the temperature distribution in a system.
The suitability of the particular approximations and models is discus
sed.