X-RAY-FLUORESCENCE ANALYSIS USING SYNCHROTRON-RADIATION (SYXRF)

The SYnchrotron X-Ray Fluorescence analysis (SYXRF) is a powerful tool for the analytical determination of trace element concentrations. By using synchrotron radiation instead of an X-ray tube, the sensitivity of the XRF method is greatly enhanced. This is due to the high intensi ty, spectral distribution, beam collimation and to background reductio n by polarization effects. Excitation with the white spectrum as well as monoenergetic excitation are possible, which has significant influe nce on the obtained physical detection limits. Quantification of the r esults is possible by applying different models, including the recentl y developed Monte-Carlo simulation technique. Microbeam analysis is po ssible by collimating and focusing the beam to a spot size in the mu m range. By use of the recently developed capillary optics, an intensit y gain can be achieved even for small beam sizes. The SYXRF method is presently used in numerous application fields, including geoscience, m aterial sciences, biology, and examination of historical artefacts.