SURFACE-CHEMISTRY FOR ATOMIC LAYER GROWTH

Citation
Sm. George et al., SURFACE-CHEMISTRY FOR ATOMIC LAYER GROWTH, Journal of physical chemistry, 100(31), 1996, pp. 13121-13131
Citations number
68
Categorie Soggetti
Chemistry Physical
ISSN journal
00223654
Volume
100
Issue
31
Year of publication
1996
Pages
13121 - 13131
Database
ISI
SICI code
0022-3654(1996)100:31<13121:SFALG>2.0.ZU;2-C
Abstract
Atomic layer controlled film growth is an important technological and scientific goal that is closely tied to many issues in surface chemist ry. This article first reviews the basic concepts of atomic layer grow th using molecular precursors and binary reaction sequence chemistry. Many examples are given for the various films that have been grown usi ng this atomic layer growth technique. The paradigms for atomic layer epitaxy (ALE) and atomic layer processing (ALP) are then discussed in terms of self-limiting surface reactions. Recent investigations of the surface chemistry of SiO2 and Al2O3, ALP and GaAs ALE are examined an d used to illustrate the possible mechanisms of atomic layer growth. S ubsequently, the characteristics of film deposition using atomic layer growth techniques are explored using recent examples for Al2O3 ALP. T he structure of the deposited films is also reviewed using results fro m previous Al2O3 deposition investigations. This article then conclude s by discussing possible complications to studies of atomic layer cont rolled growth using binary reaction sequence chemistry.