KINETIC-ENERGY RELEASED DISTRIBUTIONS OF IONS DESORBED FROM H2O SI(100) ADSORPTION SYSTEM BY O 1S EXCITATION/

Citation
T. Sekiguchi et al., KINETIC-ENERGY RELEASED DISTRIBUTIONS OF IONS DESORBED FROM H2O SI(100) ADSORPTION SYSTEM BY O 1S EXCITATION/, Journal of electron spectroscopy and related phenomena, 80, 1996, pp. 65-68
Citations number
13
Categorie Soggetti
Spectroscopy
ISSN journal
03682048
Volume
80
Year of publication
1996
Pages
65 - 68
Database
ISI
SICI code
0368-2048(1996)80:<65:KRDOID>2.0.ZU;2-N
Abstract
In order to investigate mechanisms of photon stimulated ion desorption (PSID) of H2O-adsorbed Si(100) surface, we have measured ion kinetic energy distributions (IKEDs) of H+ and O+ in the O Is excitation regio n (500-750 eV), using a time-of-flight technique. The observed IKEDs o f desorbing species (H+ and O+) evidently reflect the primary core exc itations. The average kinetic energy spectrum of H+ is roughly similar to the ion desorption yield and shows a resonant peak at 535 eV and a delayed onset at 570 eV. This suggests that the average kinetic energ y is related to the ion desorption yield. The peak at 535 eV suggests that a strongly antibonding (sigma(O-H)) molecular orbital plays an i mportant role in the enhancement of ion desorption. The onset at 570 e V can be explained by multiple-hole states. It was also found that the average kinetic energy of O+ increases with increasing the excitation energy.