T. Sekiguchi et al., KINETIC-ENERGY RELEASED DISTRIBUTIONS OF IONS DESORBED FROM H2O SI(100) ADSORPTION SYSTEM BY O 1S EXCITATION/, Journal of electron spectroscopy and related phenomena, 80, 1996, pp. 65-68
In order to investigate mechanisms of photon stimulated ion desorption
(PSID) of H2O-adsorbed Si(100) surface, we have measured ion kinetic
energy distributions (IKEDs) of H+ and O+ in the O Is excitation regio
n (500-750 eV), using a time-of-flight technique. The observed IKEDs o
f desorbing species (H+ and O+) evidently reflect the primary core exc
itations. The average kinetic energy spectrum of H+ is roughly similar
to the ion desorption yield and shows a resonant peak at 535 eV and a
delayed onset at 570 eV. This suggests that the average kinetic energ
y is related to the ion desorption yield. The peak at 535 eV suggests
that a strongly antibonding (sigma(O-H)) molecular orbital plays an i
mportant role in the enhancement of ion desorption. The onset at 570 e
V can be explained by multiple-hole states. It was also found that the
average kinetic energy of O+ increases with increasing the excitation
energy.