MULTIPLE-SCATTERING STUDY OF SYNCHROTRON-RADIATION PHOTOELECTRON DIFFRACTION FROM SI(001)2X2-IN SURFACE

Citation
X. Chen et al., MULTIPLE-SCATTERING STUDY OF SYNCHROTRON-RADIATION PHOTOELECTRON DIFFRACTION FROM SI(001)2X2-IN SURFACE, Journal of electron spectroscopy and related phenomena, 80, 1996, pp. 147-150
Citations number
10
Categorie Soggetti
Spectroscopy
ISSN journal
03682048
Volume
80
Year of publication
1996
Pages
147 - 150
Database
ISI
SICI code
0368-2048(1996)80:<147:MSOSPD>2.0.ZU;2-P
Abstract
Synchrotron radiation photoelectron diffraction (PED) from the Si(001) 2x2-In surface was measured for the well resolved In 4d spin-orbit dou blet (4d(3/2) and 4d(5/2)) at photon energy of 100 eV. It is found tha t the two diffraction patterns originating from different core-level s tates are notably different from each other. A multiple scattering clu ster method was applied to analyze both PED's. The optimized structure s from the two patterns take essentially a similar parallel In-dimer m odel, but the radial matrix elements and phase shifts of the photoelec tron continuums are different for time two components. We attribute th is unexpected result to a spin-orbit coupling effect near the Cooper m inima.