X. Chen et al., MULTIPLE-SCATTERING STUDY OF SYNCHROTRON-RADIATION PHOTOELECTRON DIFFRACTION FROM SI(001)2X2-IN SURFACE, Journal of electron spectroscopy and related phenomena, 80, 1996, pp. 147-150
Synchrotron radiation photoelectron diffraction (PED) from the Si(001)
2x2-In surface was measured for the well resolved In 4d spin-orbit dou
blet (4d(3/2) and 4d(5/2)) at photon energy of 100 eV. It is found tha
t the two diffraction patterns originating from different core-level s
tates are notably different from each other. A multiple scattering clu
ster method was applied to analyze both PED's. The optimized structure
s from the two patterns take essentially a similar parallel In-dimer m
odel, but the radial matrix elements and phase shifts of the photoelec
tron continuums are different for time two components. We attribute th
is unexpected result to a spin-orbit coupling effect near the Cooper m
inima.