A NEW PROCEDURE FOR MEASURING THE DECOHESION ENERGY FOR THIN DUCTILE FILMS ON SUBSTRATES - REPLY

Authors
BAGCHI A EVANS AG
Citation
A. Bagchi et Ag. Evans, A NEW PROCEDURE FOR MEASURING THE DECOHESION ENERGY FOR THIN DUCTILE FILMS ON SUBSTRATES - REPLY, Journal of materials research, 11(8), 1996, pp. 2112-2113
Citations number
12
Categorie Soggetti
Material Science
Journal title
Journal of materials research → ACNP
ISSN journal
08842914
Volume
11
Issue
8
Year of publication
1996
Pages
2112 - 2113
Database
ISI
SICI code
0884-2914(1996)11:8<2112:ANPFMT>2.0.ZU;2-C
Abstract
Large scale yielding (LSY), in general, has a profound influence on th e fracture toughness of metal/dielectric interfaces. For thin metal fi lm/dielectric systems exhibiting ''weak'' bonding, small-scale yieldin g (SSY) prevails due to local plastic dissipation intrinsic to crack g rowth and the high yield strength of metal thin films. For systems inv olving low yield strength materials and strong interfaces, a more deta iled LSY methodology needs to be developed.