2-DIMENSIONAL ELECTRON-GAS PROPERTIES OF ALGAN GAN HETEROSTRUCTURES GROWN ON 6H-SIC AND SAPPHIRE SUBSTRATES/

High quality Al0.15Ga0.85N/GaN heterostructures have been fabricated o n 6H-SiC and sapphire substrates by metalorganic vapor phase epitaxy ( MOVPE). A temperature independent mobility, indicative of the presence of a two-dimensional electron gas (2DEG), was observed in all samples below 80 K, The highest low temperature 2DEG mobility, 7500 cm(2)/V s , was measured in AlGaN/ GaN grown on 6H-SiC; the sheet carrier densit y was 6 x 10(12) cm(-2). Strong, well resolved, Shubnikov-de Haas osci llations were observed in fields as low as 3 T and persisted to temper atures as high as 15 K. Hall effect measurements also revealed the pre sence of well-defined plateaus in the Hall resistance. The high qualit y 2DEG properties of the AlGaN/GaN heterostructures grown on 6H-SiC ar e attributed to the absence of significant parallel conduction paths i n the material. (C) 1996 American Institute of Physics.