X-RAY PHOTOELECTRON DIFFRACTION FOR PURE AND NB-DOPED KTAO3 - SITE DETERMINATION FOR THE NB ATOMS

Citation
R. Niemann et al., X-RAY PHOTOELECTRON DIFFRACTION FOR PURE AND NB-DOPED KTAO3 - SITE DETERMINATION FOR THE NB ATOMS, Journal of physics. Condensed matter, 8(32), 1996, pp. 5837-5842
Citations number
25
Categorie Soggetti
Physics, Condensed Matter
ISSN journal
09538984
Volume
8
Issue
32
Year of publication
1996
Pages
5837 - 5842
Database
ISI
SICI code
0953-8984(1996)8:32<5837:XPDFPA>2.0.ZU;2-V
Abstract
We present a set of polar-angle-dependent x-ray photoelectron spectra (XPS) obtained from in situ cleaved single-crystalline pure KTaO3. The variation of the intensity for different angles can be explained by t he diffraction of the emitted electrons by the surrounding atoms of th e emitter and thus may be used as a 'fingerprint' for the location of emitting impurity atoms. Measurements were carried out on niobium-dope d KTaO3. The atomic position of the niobium atoms was deduced from the comparison of the angle-dependent spectra, giving a clear hint that t antalum is replaced by niobium.