R. Niemann et al., X-RAY PHOTOELECTRON DIFFRACTION FOR PURE AND NB-DOPED KTAO3 - SITE DETERMINATION FOR THE NB ATOMS, Journal of physics. Condensed matter, 8(32), 1996, pp. 5837-5842
We present a set of polar-angle-dependent x-ray photoelectron spectra
(XPS) obtained from in situ cleaved single-crystalline pure KTaO3. The
variation of the intensity for different angles can be explained by t
he diffraction of the emitted electrons by the surrounding atoms of th
e emitter and thus may be used as a 'fingerprint' for the location of
emitting impurity atoms. Measurements were carried out on niobium-dope
d KTaO3. The atomic position of the niobium atoms was deduced from the
comparison of the angle-dependent spectra, giving a clear hint that t
antalum is replaced by niobium.