SURFACE CHEMICAL CHARACTERIZATION USING XPS AND TOF-SIMS OF LATEX-PARTICLES PREPARED BY THE EMULSION COPOLYMERIZATION OF METHACRYLIC-ACID AND STYRENE

Authors
DAVIES MC LYNN RAP HEARN J PAUL AJ VICKERMAN JC WATTS JF
Citation
Mc. Davies et al., SURFACE CHEMICAL CHARACTERIZATION USING XPS AND TOF-SIMS OF LATEX-PARTICLES PREPARED BY THE EMULSION COPOLYMERIZATION OF METHACRYLIC-ACID AND STYRENE, Langmuir, 12(16), 1996, pp. 3866-3875
Citations number
59
Categorie Soggetti
Chemistry Physical
Journal title
Langmuir → ACNP
ISSN journal
07437463
Volume
12
Issue
16
Year of publication
1996
Pages
3866 - 3875
Database
ISI
SICI code
0743-7463(1996)12:16<3866:SCCUXA>2.0.ZU;2-4
Abstract
A series of colloids based on poly(styrene) were prepared by emulsion copolymerization with various proportions of methacrylic acid. X-ray p hotoelectron spectroscopy (XPS) and time-of-flight secondary ion mass spectrometry (ToF-SIMS) were used to monitor changes in particle surfa ce composition and indicated a substantial enrichment of the methacryl ic acid component. Further evidence for the presence of carboxyl group s at the particle surfaces was provided by electrophoretic mobility me asurements, which showed a marked increase over the pH range studied.