INTERFACE CHARACTERIZATION OF NANOSIZED B-DOPED SI3N4 SIC CERAMICS/

Citation
A. Jalowiecki et al., INTERFACE CHARACTERIZATION OF NANOSIZED B-DOPED SI3N4 SIC CERAMICS/, Composites. Part A, Applied science and manufacturing, 27(9), 1996, pp. 717-721
Citations number
21
Categorie Soggetti
Materials Sciences, Composites
ISSN journal
1359835X
Volume
27
Issue
9
Year of publication
1996
Pages
717 - 721
Database
ISI
SICI code
1359-835X(1996)27:9<717:ICONBS>2.0.ZU;2-J
Abstract
Recent results on the crystallization behaviour of nanosized boron-dop ed silicon carbonitride ceramics as revealed by structural characteriz ation with various transmission electron microscopy methods are descri bed. Ceramic composites in the quaternary system Si-C-N-B were produce d by polymer pyrolysis of doped polysilazanes without the presence of oxide sintering additives. Annealing at elevated temperatures induces the crystallization of the initially amorphous materials, resulting in a microstructure consisting of nanocrystalline Si3N4, SiC and turbost ratic BN(C). Attention is focused on the BN(C) interface layers and th e lattice structure of the small-scaled crystallites in these nanocrys talline ceramics.