A. Jalowiecki et al., INTERFACE CHARACTERIZATION OF NANOSIZED B-DOPED SI3N4 SIC CERAMICS/, Composites. Part A, Applied science and manufacturing, 27(9), 1996, pp. 717-721
Recent results on the crystallization behaviour of nanosized boron-dop
ed silicon carbonitride ceramics as revealed by structural characteriz
ation with various transmission electron microscopy methods are descri
bed. Ceramic composites in the quaternary system Si-C-N-B were produce
d by polymer pyrolysis of doped polysilazanes without the presence of
oxide sintering additives. Annealing at elevated temperatures induces
the crystallization of the initially amorphous materials, resulting in
a microstructure consisting of nanocrystalline Si3N4, SiC and turbost
ratic BN(C). Attention is focused on the BN(C) interface layers and th
e lattice structure of the small-scaled crystallites in these nanocrys
talline ceramics.