Gh. Li et al., PHOTOLUMINESCENCE AND ACTIVATION ON SI-GAAS BY SI+ IMPLANTATION AND FOLLOWING RAPID THERMAL ANNEALING, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 117(1-2), 1996, pp. 112-116
Photoluminescence (PL) and electrical characteristics of SI-GaAs, Si+-
implanted and following rapid thermal annealing (RTA), were investigat
ed, The PL spectra of Si-GA-C-As, Ga-i-Si-As, and V-As-Si-As were obta
ined. This paper concentrates on the PL peak at 1.36 eV which was prov
en as an emission of the Si-Ga-V-Ga combination by Si+ + P+ dual impla
ntation. The results indicate that the peak at 1.36 eV appears when th
e ratio of As:Ga increased during the processing. Also high activation
was obtained for the sample under the same conditions. More discussio
n on the mechanism of Si+ implanted SI-GaAs has been made based on the
Morrow model [J. Appl. Phys, 64 (1988) 1889].