ORIENTATION DEPENDENCE OF THE PROJECTILE X-RAYS FROM HIGHLY STRIPPED S AND CL IONS CHANNELED ALONG [100]SI CRYSTAL

Authors
NANAL V TRIBEDI LC KURUP MB PRASAD KG TANDON PN
Citation
V. Nanal et al., ORIENTATION DEPENDENCE OF THE PROJECTILE X-RAYS FROM HIGHLY STRIPPED S AND CL IONS CHANNELED ALONG [100]SI CRYSTAL, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 115(1-4), 1996, pp. 184-186
Citations number
9
Categorie Soggetti
Physics, Nuclear","Nuclear Sciences & Tecnology","Instument & Instrumentation
Journal title
Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms → ACNP
ISSN journal
0168583X
Volume
115
Issue
1-4
Year of publication
1996
Pages
184 - 186
Database
ISI
SICI code
0168-583X(1996)115:1-4<184:ODOTPX>2.0.ZU;2-7
Abstract
The hyper (normal) projectile K-alpha(h)(K-alpha(n)) X ray yield exhib its a maximum close to half the critical angle for channeling (psi(c)/ 2) for fully stripped S (hydrogen-like S and Cl) ions channeled along the [100] axis of a 0.17 mu m Si single crystal. This can be qualitati vely understood in terms of the interplay between the freezing of the incident charge states and the electron density sampled by the channel ed ions.