PHOTOEMISSION EXTENDED FINE-STRUCTURE STUDY OF THE SIO2 SI(111) INTERFACE (VOL 77, PG 2758, 1996)/

Authors
SIEGER MT LUH DA MILLER T CHIANG TC
Citation
Mt. Sieger et al., PHOTOEMISSION EXTENDED FINE-STRUCTURE STUDY OF THE SIO2 SI(111) INTERFACE (VOL 77, PG 2758, 1996)/, Physical review letters, 77(26), 1996, pp. 5312-5312
Citations number
1
Categorie Soggetti
Physics
Journal title
Physical review letters → ACNP
ISSN journal
00319007
Volume
77
Issue
26
Year of publication
1996
Pages
5312 - 5312
Database
ISI
SICI code
0031-9007(1996)77:26<5312:PEFSOT>2.0.ZU;2-R