Cg. Cassandras, OPTIMAL POLICIES FOR THE YIELD LEARNING-PROBLEM IN MANUFACTURING SYSTEMS, IEEE transactions on automatic control, 41(8), 1996, pp. 1210-1213
Citations number
9
Categorie Soggetti
Controlo Theory & Cybernetics","Robotics & Automatic Control","Engineering, Eletrical & Electronic
The ''yield learning'' problem encountered in many manufacturing syste
ms involves controlling the production rate of a process so as to maxi
mize cumulative rewards over some time interval. Because yield improve
ment occurs as a result of discrete events coinciding with lot process
ing completions, a basic tradeoff arises as high production rates incr
ease rewards for a given yield but also cause longer average lot lead
times which delay the events that trigger yield improvement. We show t
hat in some cases simple bang-bang solutions can be obtained for this
problem through standard optimal control techniques.