OPTIMAL POLICIES FOR THE YIELD LEARNING-PROBLEM IN MANUFACTURING SYSTEMS

Authors
Citation
Cg. Cassandras, OPTIMAL POLICIES FOR THE YIELD LEARNING-PROBLEM IN MANUFACTURING SYSTEMS, IEEE transactions on automatic control, 41(8), 1996, pp. 1210-1213
Citations number
9
Categorie Soggetti
Controlo Theory & Cybernetics","Robotics & Automatic Control","Engineering, Eletrical & Electronic
ISSN journal
00189286
Volume
41
Issue
8
Year of publication
1996
Pages
1210 - 1213
Database
ISI
SICI code
0018-9286(1996)41:8<1210:OPFTYL>2.0.ZU;2-#
Abstract
The ''yield learning'' problem encountered in many manufacturing syste ms involves controlling the production rate of a process so as to maxi mize cumulative rewards over some time interval. Because yield improve ment occurs as a result of discrete events coinciding with lot process ing completions, a basic tradeoff arises as high production rates incr ease rewards for a given yield but also cause longer average lot lead times which delay the events that trigger yield improvement. We show t hat in some cases simple bang-bang solutions can be obtained for this problem through standard optimal control techniques.