INVESTIGATIONS ON CALIBRATION SOURCES FOR SOFT-X-RAY PLASMA SPECTROSCOPY AND IMPURITY MONITORS

Citation
U. Schumacher et al., INVESTIGATIONS ON CALIBRATION SOURCES FOR SOFT-X-RAY PLASMA SPECTROSCOPY AND IMPURITY MONITORS, Review of scientific instruments, 67(8), 1996, pp. 2826-2830
Citations number
13
Categorie Soggetti
Physics, Applied","Instument & Instrumentation
ISSN journal
00346748
Volume
67
Issue
8
Year of publication
1996
Pages
2826 - 2830
Database
ISI
SICI code
0034-6748(1996)67:8<2826:IOCSFS>2.0.ZU;2-W
Abstract
For absolute soft-x-ray line intensity measurements to deduce elementa l concentrations and parameters of magnetically confined plasmas large -area x-ray sources are developed and investigated. These calibration sources use K, L, and M transitions in different elements and cover a wide photon energy (and wavelength) range. From the measured absolute line intensities of these sources the quantum efficiency values of num erous elements for K-, L-, and M-line emission per incident electron a re deduced. They represent the basis of simple soft-x-ray monitors for impurities in fusion plasmas. (C) 1996 American Institute of Physics.