THIN-FILM MECHANICALLY CONTROLLABLE BREAK JUNCTIONS

Citation
Rjp. Keijsers et al., THIN-FILM MECHANICALLY CONTROLLABLE BREAK JUNCTIONS, Review of scientific instruments, 67(8), 1996, pp. 2863-2866
Citations number
16
Categorie Soggetti
Physics, Applied","Instument & Instrumentation
ISSN journal
00346748
Volume
67
Issue
8
Year of publication
1996
Pages
2863 - 2866
Database
ISI
SICI code
0034-6748(1996)67:8<2863:TMCBJ>2.0.ZU;2-V
Abstract
An adaptation of the mechanically controllable break junction techniqu e using thin metallic films to create point contacts and tunnel juncti ons is presented. The junctions that are created using this very simpl e method are extremely stable, and can easily be adjusted from rather large point contacts (R approximate to 0.1 Omega) to high-resistance ( 10(10) Omega) tunnel junctions. The electrodes can be kept very clean by breaking the sample in ultrahigh vacuum or in a very pure helium at mosphere at 1-4 K. Point-contact spectra of good quality were measured for contacts of 0.1-500 Omega. For very small contacts, the expected steplike increase of junction resistance with decreasing contact size was observed, with a jump to tunneling behavior occurring at resistanc es of 12-14 k Omega. (C) 1996 American Institute of Physics.