Th. Hsiung et al., USING (CO)-C-13 AND (OO)-O-18-O-18 TRACERS TO STUDY THE REMOVAL OF PARTS-PER-MILLION CO AND O-2 FROM N-2 OVER A NI-AL2O3 CATALYST, Journal of the Electrochemical Society, 143(8), 1996, pp. 2429-2434
The removal of parts per million of CO and O-2 from nitrogen over a co
mmercial Ni-Al2O3 catalyst was studied using either (CO)-C-13 or (OO)-
O-18-O-18 as a chemical tracer. An atmospheric pressure ionization mas
s spectrometer (APIMS) was used to analyze the impurities in nitrogen.
This highly sensitive instrument was able to quantify the impurities
to concentration levels below parts per billion. The tracer experiment
s permitted a determination of the actual performance of the Ni-purifi
er since the APIMS distinguished the feed O-2 (i.e., (OO)-O-18-O-18) f
rom the background O-2 and quantified CO (i.e., (CO)-C-13) in the pres
ence of N-2. The experiments demonstrated that the concentration of th
ese impurities in the product nitrogen could be controlled to below 10
0 parts per trillion, a level that is expected to be required for futu
re semiconductor manufacturing. The results also provided some insight
s on the oxidation mechanism, suggesting the exchange of the O atom be
tween the adsorbed CO anti the adsorbed O-2.