The vacuum packaging of resonant micromachined sensors using a solder
reflow or brazing technique is disclosed. Various packaging processes,
such as die adhesive selection and processing, solder selection and r
eflow temperature are experimentally treated with respect to the Q-val
ue obtained by both cantilever- and ring-shaped micromachines. The sta
bility of nickel micromachines under low-amplitude resonant conditions
is demonstrated using this packaging technique. The advantages of thi
s packaging method for development and low-volume production devices a
re presented.