THE INFLUENCE OF THE AMORPHOUS OVERLAYER ON THE PHOTOELECTRON DIFFRACTION INTENSITIES OF THE SINGLE-CRYSTAL

Authors
NEFEDOV VI FEDOROVA IS PEISERT H STREUBEL P CHASSE T SZARGAN R
Citation
Vi. Nefedov et al., THE INFLUENCE OF THE AMORPHOUS OVERLAYER ON THE PHOTOELECTRON DIFFRACTION INTENSITIES OF THE SINGLE-CRYSTAL, Doklady Akademii nauk. Rossijskaa akademia nauk, 348(3), 1996, pp. 339-342
Citations number
4
Categorie Soggetti
Multidisciplinary Sciences
Journal title
Doklady Akademii nauk. Rossijskaa akademia nauk → ACNP
ISSN journal
08695652
Volume
348
Issue
3
Year of publication
1996
Pages
339 - 342
Database
ISI
SICI code
0869-5652(1996)348:3<339:TIOTAO>2.0.ZU;2-0