STUDIES OF NA-SEGREGATION AT NI ALPHA-QUARTZ INTERFACES/

Citation
P. Haussalo et al., STUDIES OF NA-SEGREGATION AT NI ALPHA-QUARTZ INTERFACES/, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 120(1-4), 1996, pp. 266-269
Citations number
16
Categorie Soggetti
Physics, Nuclear","Nuclear Sciences & Tecnology","Instument & Instrumentation
ISSN journal
0168583X
Volume
120
Issue
1-4
Year of publication
1996
Pages
266 - 269
Database
ISI
SICI code
0168-583X(1996)120:1-4<266:SONANA>2.0.ZU;2-U
Abstract
Ni/alpha-quartz bilayers were irradiated at 77 K with 200 keV Na+ ions at a fluence of 5 x 10(16) ions/cm(2) and annealed in hydrogen up to 883 K. The Na-migration at the Ni/alpha-quartz interface and towards t he Ni-surface, the hydrogen storage in the irradiated region, and the Ni/alpha-quartz interface broadening due to Na implantation and decora tion were investigated via Rutherford Backscattering Spectrometry (RES ) and Resonant Nuclear Reaction Analysis (RNRA). We demonstrate that a fter a one hour-annealing at 833 K a large fraction of the implanted N a has been trapped at the Ni/alpha-quartz interface from where it is r eleased at 883 K. The results are discussed and compared with our find ings in Na-irradiated metals and silicon compounds.