P. Haussalo et al., STUDIES OF NA-SEGREGATION AT NI ALPHA-QUARTZ INTERFACES/, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 120(1-4), 1996, pp. 266-269
Ni/alpha-quartz bilayers were irradiated at 77 K with 200 keV Na+ ions
at a fluence of 5 x 10(16) ions/cm(2) and annealed in hydrogen up to
883 K. The Na-migration at the Ni/alpha-quartz interface and towards t
he Ni-surface, the hydrogen storage in the irradiated region, and the
Ni/alpha-quartz interface broadening due to Na implantation and decora
tion were investigated via Rutherford Backscattering Spectrometry (RES
) and Resonant Nuclear Reaction Analysis (RNRA). We demonstrate that a
fter a one hour-annealing at 833 K a large fraction of the implanted N
a has been trapped at the Ni/alpha-quartz interface from where it is r
eleased at 883 K. The results are discussed and compared with our find
ings in Na-irradiated metals and silicon compounds.