T. Toyama et al., VISIBLE PHOTOLUMINESCENCE AND ELECTROLUMINESCENCE FROM ELECTROCHEMICALLY FORMED NANOCRYSTALLINE SI THIN-FILM, Applied physics letters, 69(9), 1996, pp. 1261-1263
Visible photo- (PL) and electroluminescence (EL) were observed at room
temperature from nanocrystalline Si (nc-Si) thin film; nc-Si was elec
trochemically formed in HF aqueous solution from baron doped microcrys
talline Si (mu c-Si) deposited by a rf plasma chemical vapor depositio
n method on a glass substrate with a SnO2 transparent conductive layer
. From the scanning electron microscope images, the ''pore'' structure
is not feued on the surface of the nc-Si thin film. PL occurs with a
broadband spectrum peaking at an energy around 1.7 eV and its spectral
shape resembles that of conventional porous Si made from a crystallin
e Si substrate. The dependence of PL intensity on crystalline volume f
raction in mu c-Si implies that the quantum size effects operate in th
e emission process in nc-Si. Visible EL emission was observed in a p-i
-n heterostructured diode consisting of the nc-Si and amorphous layers
with the spectral peak energy of 1.8 eV. (C) 1996 American Institute
of Physics.