REAL-TIME SCANNING HALL PROBE MICROSCOPY

Citation
A. Oral et al., REAL-TIME SCANNING HALL PROBE MICROSCOPY, Applied physics letters, 69(9), 1996, pp. 1324-1326
Citations number
15
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00036951
Volume
69
Issue
9
Year of publication
1996
Pages
1324 - 1326
Database
ISI
SICI code
0003-6951(1996)69:9<1324:RSHPM>2.0.ZU;2-F
Abstract
We describe a low-noise scanning Hall probe microscope having unpreced ented magnetic field sensitivity (similar to 2.9x10(-8) T/root Hz at 7 7 K), high spatial resolution, (similar to 0.85 mu m),nd operating in real-time (similar to 1 frame/s) for studying flux profiles at surface s. A submicron Hall probe manufactured in a GaAs/A1GaAs two-dimensiona l electron gas (2DEG) is scanned over the sample to measure the surfac e magnetic fields using conventional scanning tunneling microscopy pos itioning techniques. Flux penetration into a high T-c YBa2Cu3O7-delta thin film has been observed in real time at 85 K with single vortex re solution. Flux is seen to enter the film in the form of vortex bundles as well as single flux quanta, Phi(0). (C) 1996 American Institute of Physics.