OPTICAL AND ELECTRONIC CHARACTERIZATION OF A ZNS MG THIN-FILM SYSTEM/

ZnS layers are widely used in optics as high refractive index films in multilayer coatings as well as for protective purposes. We have depos ited ZnS coatings on different metal films to prevent their surface de gradation when exposed to the ambient. In particular, magnesium is a v ery active material that generates a diffusive oxide layer as soon as it is removed from the vacuum chamber. Here we are presenting an optic al characterization of the ZnS/Mg/ZnS/Glass system, using Spectrophoto metry, and the Drude and Lorentz models for the dielectric function. T o determine the type and strength of the interaction between the ZnS a nd the Mg we performed a study of the interface using Auger electron s pectroscopy and scanning electron microscopy.