IMPURITY ENERGY-STATES IN CADMIUM-DOPED PB0.8SN0.2TE EPITAXIAL LAYERS

Citation
Vn. Vodopyanov et al., IMPURITY ENERGY-STATES IN CADMIUM-DOPED PB0.8SN0.2TE EPITAXIAL LAYERS, Semiconductors, 30(8), 1996, pp. 716-719
Citations number
12
Categorie Soggetti
Physics, Condensed Matter
Journal title
ISSN journal
10637826
Volume
30
Issue
8
Year of publication
1996
Pages
716 - 719
Database
ISI
SICI code
1063-7826(1996)30:8<716:IEICPE>2.0.ZU;2-Z
Abstract
The optical and electrical properties of Pb1-xSnxTe(x approximate to 0 .2) epitaxial layers, grown by the hot-wall method and doped with cadm ium in amounts of 0.1, 0.5, and 1 at. %, are investigated. It has been established on the basis of optical measurements that an impurity lev el with a temperature-dependent activation energy is present in the ba nd gap. A theoretical analysis of the measurements of the Hall coeffic ient in p-type layers shows that a level is present at a depth of 0.00 9 eV in the band gap. (C) 1996 American Institute of Physics.