MULTIPLE CONDUCTION BEHAVIOR OF BARUO3 THIN-FILM PREPARED BY PULSED-LASER ABLATION DEPOSITION

Citation
M. Gu et al., MULTIPLE CONDUCTION BEHAVIOR OF BARUO3 THIN-FILM PREPARED BY PULSED-LASER ABLATION DEPOSITION, Thin solid films, 288(1-2), 1996, pp. 95-98
Citations number
7
Categorie Soggetti
Physics, Applied","Material Science","Physics, Condensed Matter
Journal title
ISSN journal
00406090
Volume
288
Issue
1-2
Year of publication
1996
Pages
95 - 98
Database
ISI
SICI code
0040-6090(1996)288:1-2<95:MCBOBT>2.0.ZU;2-A
Abstract
In this paper, thin films of BaRuO3 prepared on a Si substrate by the pulsed laser ablation deposition method under oxygen ambient have been studied by means of X-ray diffraction, emission spectroscopy, Rutherf ord backscattering spectroscopy, RT Hall measurement and resistivity m easurement. It is interesting to find that BaRuO3 thin films, having a different thermal history examined in the same temperature range, sho w different conduction types including metallicity, semiconduction and semiconductor-metal transition. The explanation about the findings ar e given using a suggested modified energy band diagram. It is believed that the versatile electrical behavior is helpful for the use in elec trical contact materials.