AUGER-ELECTRON PEAKS OF CU IN XPS

Authors
Citation
M. Jo et A. Tanaka, AUGER-ELECTRON PEAKS OF CU IN XPS, Applied surface science, 101, 1996, pp. 11-14
Citations number
12
Categorie Soggetti
Physics, Condensed Matter","Chemistry Physical","Materials Science, Coatings & Films
Journal title
ISSN journal
01694332
Volume
101
Year of publication
1996
Pages
11 - 14
Database
ISI
SICI code
0169-4332(1996)101:<11:APOCIX>2.0.ZU;2-Z
Abstract
Intensities of photoelectron and photo-excited Auger electron peaks ob served in X-ray photoelectron spectroscopy of copper have been analyze d using a background optimization formalism. The relative intensities of L(2,3)MM peaks are proportional to those predicted by Auger transit ion probabilities. However, their absolute intensities are stronger th an those of holes created by 2p photoemission. Measurement by monochro matic X-ray photoelectron spectroscopy indicates that there is a contr ibution from a 2s hole by Coster-Kronig transition. Moreover, a spectr um of a conventional (non-monochromatic) source suggests additional 2s and 2p holes by the accompanying Bremsstrahlung.