We have investigated the oxidation of hydrogen-terminated Si(111) and
(100) surfaces stored in air, using synchrotron radiation photoemissio
n spectroscopy and infrared absorption spectroscopy in the multiple in
ternal reflection geometry. We demonstrate that water present in air i
s predominantly involved in the oxidation of the topmost layer of the
hydrogen-terminated surface. We find that native oxide starts to grow
when the surface hydrogen coverage diminishes. This trend is interpret
ed in terms of a kinetic model of oxidation in which it is assumed tha
t native oxide formation preferentially rakes place on the portion of
the surface where surface Si atoms having Si-H bonds are oxidized.