MICROWAVE PLASMA-ASSISTED LCVD GROWTH AND CHARACTERIZATION OF GAN

Citation
B. Zhou et al., MICROWAVE PLASMA-ASSISTED LCVD GROWTH AND CHARACTERIZATION OF GAN, Applied surface science, 101, 1996, pp. 643-646
Citations number
13
Categorie Soggetti
Physics, Condensed Matter","Chemistry Physical","Materials Science, Coatings & Films
Journal title
ISSN journal
01694332
Volume
101
Year of publication
1996
Pages
643 - 646
Database
ISI
SICI code
0169-4332(1996)101:<643:MPLGAC>2.0.ZU;2-3
Abstract
Gallium nitride films have been grown by microwave plasma assisted las er induced chemical vapor deposition at about 550 degrees C. Trimethyl gallium and ammonia served as group III and group V sources, respectiv ely. Ammonia was introduced into the reaction chamber by two separate lines. In one of the lines, ammonia first passed through a microwave c avity where it could be ionized into a plasma, before being delivered to the chamber. An ArF excimer laser (193 nm) was used to photodissoci ate the ammonia and trimethylgallium introduced through the other line . The room temperature electron concentration and Hall mobility of the films were measured to be in the range 10(15)-10(16) cm(-3) and up to 200 cm(2)/Vs, respectively. Strong room temperature near-band photolu minescence detected from the films indicated their good optical qualit y. The photoconductive decay of photocarriers was also investigated.