Previously, residual stresses in nitrided parts could only be measured
after nitriding. This paper describes how, for the first time, residu
al stress formation has been successfully monitored in-situ during the
gas nitriding process, using a special nitriding device installed in
an X-ray diffractometer. With this technique, the influence of nitridi
ng potential, nitriding temperature, cooling process, and carbon conte
nt of the investigated material can be demonstrated.