Experimental studies of ion beam mixing have indicated that the extent
of mixing is sensitive to the heat of mixing of the two atom types. A
nalytical studies of this phenomenon have utilized an initial short ti
me random ballistic mixing combined with a longer time diffusional pro
cess that is a function of the heat of mixing. We have utilized molecu
lar dynamics simulation with potentials of the embedded atom method to
study low energy (0.1 to 40 eV per atom) deposition of metals onto me
tal substrates. We have observed that even the short term ballistic mi
xing process is sensitive to the heat of solution. For example, Pt and
Au have similar masses as do Ni and Cu, and the heat of solution for
the potentials we utilized are -0.54 eV per Pt atom into Cu and +0.30
eV per Au atom into Ni. For 1 monolayer (200 atoms) of Pt deposited on
to Cu with 10 eV kinetic energy per Pt atom, we observed that 85 of th
e Pt atoms mixed into the Cu substrate during a simulation of 200 hs.
Under the same conditions 28 Au atoms mixed into the Ni substrate. Det
ailed study of individual mixing events shows that most of the mixing
occurs during the ballistic part of the deposition process. We report
on the deposition as a function of incident atom energy, substrate tem
perature, heat of solution of the atom pairs, and relative mass of the
pairs. We discuss the relationship of these results to theoretical an
alysis of energetic atom mixing at very low energies.