CHARACTERIZATION OF YBA2CU3O7-DELTA THIN-FILMS DEPOSITED BY DC MAGNETRON SPUTTERING

Authors
LI YP KILNER JA THOMAS J LACEY D COHEN LF CAPLIN AD LI YH SABA FM QUINCEY PG SOMEKH RE JEYNES C JAFRI ZH
Citation
Yp. Li et al., CHARACTERIZATION OF YBA2CU3O7-DELTA THIN-FILMS DEPOSITED BY DC MAGNETRON SPUTTERING, Journal of Materials Science, 31(23), 1996, pp. 6137-6144
Citations number
25
Categorie Soggetti
Material Science
Journal title
Journal of Materials Science → ACNP
ISSN journal
00222461
Volume
31
Issue
23
Year of publication
1996
Pages
6137 - 6144
Database
ISI
SICI code
0022-2461(1996)31:23<6137:COYTDB>2.0.ZU;2-Y
Abstract
It was found from plan-view transmission electron microscopy (TEM) obs ervations that c-oriented YBa2Cu3O7-delta (YBCO) films on LaAlO3, prep ared by the magnetron sputtering technique had a single crystalline-li ke YBCO matrix, but always contained some precipitates of impurity pha ses. A large number of highly defective twin boundaries were also obse rved in all of these epitaxial films. Such highly defective twin bound aries are thought to be flux pinning centres and also paths for the di ffusion of water into YBCO films. Therefore the films need to be passi vated against attack from humid air.