Recent inelastic helium atom scattering measurements of the phonon dis
persion curves of epitaxial thin films (2-30 ML) of four different typ
es of systems are analyzed within the framework of a force constant mo
del. Whereas Na/Cu(001) shows nearly flat dispersionless modes with fr
equencies at the Gamma point that follow the open standing wave sequen
ce, the other systems Pb/Cu(111), Ar(Kr)/Ag(111), and KBr/NaCl(001) re
veal a more complex behavior. These qualitative differences can be exp
lained in terms of a simple linear chain model in which the behavior i
s determined by the strength of the force constant coupling of the thi
n films to the substrate relative to the force constant within the fil
ms. Detailed slab calculations for Na/Cu(001) confirm this model and i
ndicate that the observed fiat phonon dispersion curves are related to
the strength of the interface interaction and bcc structure of the ep
itaxially grown Na thin films.