A system for analyzing single-layer optical thin films has been formul
ated by the use of artificial neural networks. The training data sets
stem from the computational results of the physical model of thin film
s, and they are used to train the artificial neural network, which, wh
en done, can give values of film parameters in the millisecond time re
gime. The fast backpropagation algorithm is employed during training.
The results of training are also given. (C) 1996 Optical Society of Am
erica