Photothermal deflection is used for mapping the absorption of bare and
coated surfaces. The same area is mapped before and after coating and
also after annealing. The great importance of the substrate with resp
ect to the total losses of the coated component is emphasized. First t
he influence of surface contamination of the bare substrate on the tot
al absorption of the coated substrate is studied for BK7 and fused-sil
ica substrates. Then the mean value of the coated-substrate absorptanc
e is shown to be strongly dependent on the type of substrate. Experime
ntal results show that this effect is associated with a localization o
f the absorption at the near surface of the substrate and at the inter
faces of the film. (C) 1996 Optical Society of America