THE COMBINATORIAL DESIGN APPROACH TO AUTOMATIC TEST-GENERATION

Authors
COHEN DM DALAL SR PARELIUS J PATTON GC
Citation
Dm. Cohen et al., THE COMBINATORIAL DESIGN APPROACH TO AUTOMATIC TEST-GENERATION, IEEE software, 13(5), 1996, pp. 83-88
Citations number
13
Categorie Soggetti
Computer Sciences","Computer Science Software Graphycs Programming
Journal title
IEEE software → ACNP
ISSN journal
07407459
Volume
13
Issue
5
Year of publication
1996
Pages
83 - 88
Database
ISI
SICI code
0740-7459(1996)13:5<83:TCDATA>2.0.ZU;2-P
Abstract
The combinatorial design method substantially reduces testing costs. T he authors describe an application in which the method reduced test pl an development from one month to less than a week. In several experime nts, the mettled demonstrated good code coverage and fault detection a bility.