DIFFERENTIAL REFLECTANCE SPECTROSCOPY OF GAAS GAALAS AT ELEVATED-TEMPERATURES/

Citation
P. Kraisingdecha et M. Gal, DIFFERENTIAL REFLECTANCE SPECTROSCOPY OF GAAS GAALAS AT ELEVATED-TEMPERATURES/, Applied physics letters, 69(10), 1996, pp. 1355-1357
Citations number
15
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00036951
Volume
69
Issue
10
Year of publication
1996
Pages
1355 - 1357
Database
ISI
SICI code
0003-6951(1996)69:10<1355:DRSOGG>2.0.ZU;2-E
Abstract
Differential reflectance (DR), a contactless optical modulation techni que, has been used to study GaAs/AlGaAs quantum wells and bulk GaAs, o ver a wide temperature range (77<T<600 K), The objective of this study was to demonstrate that DR, unlike most optical modulation spectrosco pies, can be effectively and effortlessly used at elevated temperature s, and, thus, provide considerable potential for in situ monitoring. W e have used DR to measure the temperature dependence of several critic al points of GaAs and AlxGa1-xAs (x=0.31). (C) American Institute of P hysics.